Hanwool Lee

KBR Inc.

  • 12.2.2023 High Temperature Studies of 140 nm T-gate AlGaN/GaN HEMT Devices

    Ahmad Islam, Air Force Research Laboratory Sensors Directorate, WPAFB, OH, USA
    Adam Miesle, KBR Inc.
    Nicholas P. Sepelak, KBR, Air Force Research Laboratory Sensors Directorate, WPAFB, OH, USA
    Hanwool Lee, KBR Inc.
    Dennis E. Walker Jr., Air Force Research Laboratory, Sensors Directorate, Wright-Patterson AFB, OH,
    N. Miller, Air Force Research Laboratory
    Matt Grupen, Air Force Research Laboratory, Sensors Directorate
    Kyle Liddy, Air Force Research Laboratory Sensors Directorate, WPAFB, OH, USA
    Antonio Crespo, Air Force Research Laboratory, Sensors Directorate
    Gary Hughes, Air Force Research Laboratory, Sensors Directorate, Wright-Patterson AFB, OH
    Wenjuan Zhu, University of Illinois, Urbana
    Kelson Chabak, Air Force Research Laboratory, Sensors Directorate
    Andrew J. Green, Air Force Research Laboratory, Sensors Directorate, Wright-Patterson AFB, OH,

    12.2.2023_CSMANTECH_FinalPaper_HT_Islam_rev