Hareesh Chandrasekar

Center for Device Thermography and Reliability, University of Bristol, Bristol, UK
  • May 02, 2019 // 10:30am – 10:50am

    15.1 Misinterpretation of Drain Transient Spectroscopy in GaN HEMTs: Explanation using a floating buffer model

    Manikant Singh, University of Bristol
    Serge karboyan, University of Bristol
    Hareesh Chandrasekar, Center for Device Thermography and Reliability, University of Bristol, Bristol, UK
    Trevor Martin, IQE Europe, St Mellons, Cardiff, UK
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