Loading...
Heiko Stegmann
Carl Zeiss Microscopy
-
12.0.3.2024 3D Visualization and Characterization of SiC MOSFET Junctions Using EBIC and FIB-SEM Tomography
Heiko Stegmann, Carl Zeiss MicroscopyGreg Johnson, Carl Zeiss MicroscopyDavid Taraci, Carl Zeiss MicroscopyAndreas Rummel, Kleindiek Nanotechnik