Hyuk-Min Kwon

QSI
  • 3.2.2.2024 Improved thermal reliability in base contact of full 3-inch InP Double-HBTs with fT and fmax in excess of 300 GHz

    In-Geun Lee, Kyungpook National University
    Yong-Soo Jeon, Kyungpook National University
    Yonghyun Kim, QSI
    Jacob Yun, QSI
    Ted Kim, QSI
    Hyuk-Min Kwon, QSI
    Seung Heon Shin, Korea Polytechnics
    Jae-Hak Lee, Kyungpook National University
    Kyunghoon Yang, Korea Advanced Institute of Science and Technology
    Dae-Hyun Kim, Kyungpook National University
    Loader Loading...
    EAD Logo Taking too long?

    Reload Reload document
    | Open Open in new tab

    Download [759.04 KB]