James Pomeroy
University of Bristol, Bristol, UK and 3TherMap Solutions, Bristol, UK
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May 01, 2019 // 4:30pm – 4:50pm
11.2 Channel temperature determination for GaN HEMT lifetime testing – Impact of test fixture and device layout.
Download PaperFilip Gucmann, Center for Device Thermography and Reliability (CDTR), University of Bristol, Bristol BS8 1TLJames Pomeroy, University of Bristol, Bristol, UK and 3TherMap Solutions, Bristol, UKAndrei Sarua, Center for Device Thermography and Reliability (CDTR), University of Bristol, Bristol BS8 1TL -
16.1 Effect of Manufacture on the Microstructure of GaN-on-Diamond
Download PaperDong Liu, University of Oxford, University of BristolDaniel Francis, Akash Systems, San Francisco, CA, USAFirooz Faili, Element Six Technologies, Santa Clara, CAJames Pomeroy, University of Bristol, Bristol, UK and 3TherMap Solutions, Bristol, UKDaniel Twitchen, Element Six TechnologiesMartin Kuball, University of Bristol -
8a.4 GaN-on-Diamond: Robust Mechanical and Thermal Properties
Download PaperMartin Kuball, University of BristolHuarui Sun, University of BristolDong Liu, University of Oxford, University of BristolJames Pomeroy, University of Bristol, Bristol, UK and 3TherMap Solutions, Bristol, UKDaniel Francis, Akash Systems, San Francisco, CA, USAFirooz Faili, Element Six Technologies, Santa Clara, CADaniel Twitchen, Element Six Technologies -
8b.2 Dynamic-Ron in Small and Large C-doped AlGaN/GaN-on-Si HEMTs
Download PaperSerge Karboyan, Nexperia. Manchester, UKSara Martin Horcajo, Centre for Device Thermography and Reliability (CDTR), University of BristolJames Pomeroy, University of Bristol, Bristol, UK and 3TherMap Solutions, Bristol, UKIndranil Chatterjee, H H Wills Physics Laboratory, University of Bristol, BS8 1TL, United KingdomMichael Uren, University of BristolPeter Moens, ON Semiconductor, Corp. R&DAbishek Banerjee, ON Semiconductor, Oudenaarde 9700, BelgiumMarkus Caesar, ON Semiconductor, Oudenaarde 9700, BelgiumMartin Kuball, University of Bristol -
10b.5 Transient Thermoreflectance for Device Temperature Assessment in Pulsed-Operated GaN-based HEMTs
Download PaperSara Martin Horcajo, Centre for Device Thermography and Reliability (CDTR), University of BristolJames Pomeroy, University of Bristol, Bristol, UK and 3TherMap Solutions, Bristol, UKBenoît Lambert, United Monolithic Semiconductors GermanyHelmut Jung, United Monolithic Semiconductors GmbH, Ulm, GermanyMartin Kuball, University of Bristol -
May 11, 2022 // 5:30pm
12.4 Novel thermoreflectance-based method for in-situ die attach thermal conductivity assessment in packaged devices
Download PaperZeina Abdallah, University of Bristol, Bristol, UKNathawat Poopakdec, University of Bristol, Bristol, UK and Navaminda Kasatriyadhiraj Royal Air Force AcademnyMatin Kuball, University of Bristol, Bristol, UK,James Pomeroy, University of Bristol, Bristol, UK and 3TherMap Solutions, Bristol, UK