James Pomeroy

University of Bristol, Bristol, UK and 3TherMap Solutions, Bristol, UK
  • May 01, 2019 // 4:30pm – 4:50pm

    11.2 Channel temperature determination for GaN HEMT lifetime testing – Impact of test fixture and device layout.

    Filip Gucmann, Center for Device Thermography and Reliability (CDTR), University of Bristol, Bristol BS8 1TL
    James Pomeroy, University of Bristol, Bristol, UK and 3TherMap Solutions, Bristol, UK
    Andrei Sarua, Center for Device Thermography and Reliability (CDTR), University of Bristol, Bristol BS8 1TL
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  • 16.1 Effect of Manufacture on the Microstructure of GaN-on-Diamond

    Dong Liu, University of Oxford, University of Bristol
    Daniel Francis, Element Six Technologies
    Firooz Faili, Element Six Technologies, Santa Clara, CA
    James Pomeroy, University of Bristol, Bristol, UK and 3TherMap Solutions, Bristol, UK
    Daniel Twitchen, Element Six Technologies
    Martin Kuball, University of Bristol
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  • 8a.4 GaN-on-Diamond: Robust Mechanical and Thermal Properties

    Martin Kuball, University of Bristol
    Huarui Sun, University of Bristol
    Dong Liu, University of Oxford, University of Bristol
    James Pomeroy, University of Bristol, Bristol, UK and 3TherMap Solutions, Bristol, UK
    Daniel Francis, Element Six Technologies
    Firooz Faili, Element Six Technologies, Santa Clara, CA
    Daniel Twitchen, Element Six Technologies
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  • 8b.2 Dynamic-Ron in Small and Large C-doped AlGaN/GaN-on-Si HEMTs

    Serge Karboyan, Nexperia. Manchester, UK
    Sara Martin Horcajo, Centre for Device Thermography and Reliability (CDTR), University of Bristol
    James Pomeroy, University of Bristol, Bristol, UK and 3TherMap Solutions, Bristol, UK
    Indranil Chatterjee, H H Wills Physics Laboratory, University of Bristol, BS8 1TL, United Kingdom
    Michael Uren, University of Bristol
    Peter Moens, ON Semiconductor, Corp. R&D
    Abishek Banerjee, ON Semiconductor, Oudenaarde 9700, Belgium
    Markus Caesar, ON Semiconductor, Oudenaarde 9700, Belgium
    Martin Kuball, University of Bristol
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  • 10b.5 Transient Thermoreflectance for Device Temperature Assessment in Pulsed-Operated GaN-based HEMTs

    Sara Martin Horcajo, Centre for Device Thermography and Reliability (CDTR), University of Bristol
    James Pomeroy, University of Bristol, Bristol, UK and 3TherMap Solutions, Bristol, UK
    Benoît Lambert, United Monolithic Semiconductors Germany
    Helmut Jung, United Monolithic Semiconductors GmbH, Ulm, Germany
    Martin Kuball, University of Bristol
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  • May 11, 2022 // 5:30pm

    12.4 Novel thermoreflectance-based method for in-situ die attach thermal conductivity assessment in packaged devices

    Zeina Abdallah, University of Bristol, Bristol, UK
    Nathawat Poopakdec, University of Bristol, Bristol, UK and Navaminda Kasatriyadhiraj Royal Air Force Academny
    Matin Kuball, University of Bristol, Bristol, UK,
    James Pomeroy, University of Bristol, Bristol, UK and 3TherMap Solutions, Bristol, UK

    Abstract

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