Jeremy Middleton*

TriQuint Semiconductor, Inc.

  • 17.1 RF DS Yield Improvement through ZONAL Technique for pHEMT Product

    Yiping Wang, Qorvo Inc.
    Pat Hamilton, Qorvo Inc.
    Robert Waco, Qorvo Inc.
    Jeremy Middleton*, TriQuint Semiconductor, Inc.
    Frank Barnes, Qorvo Inc.
    Andrew Choo, UP! Strategies Consulting
    Download Paper

  • 4.3 Systematic Data Mining Approaches for Yield Improvement

    Yiping Wang, Qorvo Inc.
    Pat Hamilton, Qorvo Inc.
    Robert Waco, Qorvo Inc.
    Jeremy Middleton*, TriQuint Semiconductor, Inc.
    Download Paper

  • 10a.1 Uniformity Improvement and Defect Reduction of NiCr Thin Film Resistor

    Chang’e Weng, Qorvo
    Jinhong Yang, Qorvo
    Ronald Herring, Qorvo
    Don Hamilton, Qorvo
    Kaushik Vaidyanathan, Qorvo Inc.
    Brian Zevenbergen, Qorvo, Inc.
    Fred Pool, Qorvo
    Jeremy Middleton*, TriQuint Semiconductor, Inc.
    Download Paper