Jerry Beene

TriQuint Semiconductor,TX

  • The Use of a Structured Approach to Solve Yield Limiting Defects in a Compound Semiconductor Factory

    Jan Campbell
    Qizhi He
    Howie Yang, TriQuint Semiconductor,TX
    Martin Ivie
    John Gibbon, Qorvo
    Darrel Lupo, TriQuint Semiconductor,TX
    Dario Nappa, TriQuint Semiconductor,TX
    Jerry Beene, TriQuint Semiconductor,TX

  • Implementation of Value Added Kaizens (VAK) in a GaAs Manufacturing Facility

    Jan Campbell
    Rick Cobo, TriQuint Semiconductor, TX
    David Beene, TriQuint Semiconductor, TX
    Jerry Beene, TriQuint Semiconductor,TX
    Gary Head
    Martin Ivie
    Pavan Bhatia,  Brewer Science, TriQuint Semiconductor
    Greg Baker, TriQuint Semiconductor, TX

  • Set up and Characterization of an Optical Wide Stepper Process For DR15 Technology as a replacement for E-Beam Lithography

    Amy Zhou, TriQuint Semiconductor, TX
    Jerry Beene, TriQuint Semiconductor,TX
    Marcus King, TriQuint Semiconductor, TX
    Ming-Yih Kao, Qorvo, Inc.
    Hua-Tang Chen, Qorvo, Inc.
    Chris Puckett, TriQuint Semiconductor