Jie Wei
University of Electronic Science and Technology of China, Chengdu, China
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May 02, 2019 // 3:40pm – 4:30pm
18.13 A Novel AlGaN/GaN MIS-HEMT with Enhanced Breakdown Voltage and Reduced Interface Trap Density
Anbang Zhang, University of Electronic Science and Technology of China, Chengdu, ChinaChao Yang, University of Electronic Science and Technology of China, Chengdu, ChinaXiaorong Luo, University of Electronic Science and Technology of China, Chengdu, ChinaTao Sun, University of Electronic Science and Technology of China, Chengdu, ChinaDongfa Ouyang, University of Electronic Science and Technology of China, Chengdu, ChinaSiyu Deng, University of Electronic Science and Technology of China, Chengdu, ChinaJie Wei, University of Electronic Science and Technology of China, Chengdu, ChinaBo Zhang, University of Electronic Science and Technology of China