John Gibbon

Qorvo

  • The Use of a Structured Approach to Solve Yield Limiting Defects in a Compound Semiconductor Factory

    Jan Campbell
    Qizhi He
    Howie Yang, TriQuint Semiconductor,TX
    Martin Ivie
    John Gibbon, Qorvo
    Darrel Lupo, TriQuint Semiconductor,TX
    Dario Nappa, TriQuint Semiconductor,TX
    Jerry Beene, TriQuint Semiconductor,TX

  • 17.3 The Mechanism of Cu Seed Residue Formation

    Linlin Huang, Qorvo, Inc
    Yinbao Yang, Qorvo, Inc.
    Xiaokang Huang, Qorvo
    David Gonzalez, Qorvo, Inc.
    Gaurav Gupta, Qorvo
    John Gibbon, Qorvo
    Louis Breaux, Qorvo
    Duofeng Yue, Qorvo, Inc.
    Download Paper

  • 17.4 Four Level Category Commonality and a Loophole in Is/Is Not Analysis

    Xiaokang Huang, Qorvo
    Joonbum Kwon, Qorvo
    Elda Clarke, Qorvo
    Gaurav Gupta, Qorvo
    Raymond Wands, Qorvo
    Francis Celii, Qorvo
    Van Tran, Qorvo
    Louis Breaux, Qorvo
    John Gibbon, Qorvo
    Jaime Trujillo, Qorvo
    Karsten Mausolf, Qorvo
    Michael Lube, Qorvo
    Craig Hall, Qorvo
    Download Paper