Jr.
Naval Research Laboratory
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Boron-Doped P Nanocrystalline Diamond Gate Electrode for AlGaN-GaN HEMTs
Marko J. Tadjer, U.S. Naval Research LaboratoryTatyana I. Feygelson, American Society for Engineering Education, United States Naval Research Lab. Universidad Politecnica de MadridJennifer K. Hite, Naval Research LaboratoryBradford B. Pate, U.S. Naval Research LaboratoryCharles R. Eddy, Naval Research LaboratoryJr., Naval Research LaboratoryFrancis J. Kub, Naval Research Laboratory -
Manufacturing Progress for InP-based 500 Gbps Photonic Integrated Circuits
Richard P. SchneiderJr., Naval Research LaboratoryJacco L. PleumeekersDamien J. H. LambertPeter W. EvansAndrew G. DentaiPaul Liu, Infinera CorporationJon RossiScott CraigMargherita LaiVikrant Lal, Infinera CorporationNaksup KimEva StrzeleckaPavel StudenkovAdam James, Infinera CorporationScott CorzineKuan-Pei YapPeter Debackere, Infinera CorporationShashank AgasheJeffrey GlickChristopher HillQuisheng ChenWayne WilliamsSanjeev MurthyRanjani MuthiahMark MisseyScott DeMarsMehrdad Ziari, Infinera CorporationMasaki KatoRadhakrishnan NagarajanArnold ChenSheila HurttFred Kish, North Carolina State University -
18.3 Threshold Voltage Control by Tuning Charge in ZrO2 Gate Dielectrics for Normally-off AlGaN/GaN MOS-HEMTs
Virginia Wheeler, U.S. Naval Research LaboratoryDavid Shahin, University of MarylandMarko Tadjer, U.S. Naval Research LaboratoryLunet Luna, U.S. Naval Research LaboratoryAndrew Koehler, U. S. Naval Research LaboratoryKarl D. Hobart, U.S. Naval Research LaboratoryFrancis Kub, U.S. Naval Research LaboratoryCharles Eddy, US Naval Research LaboratoryJr., Naval Research Laboratory -
20.5 Characterization of ALD High-k Dielectrics in GaN and Ga2O3 Metal-Oxide-Semiconductor Systems
David Shahin, University of MarylandVirginia Wheeler, U.S. Naval Research LaboratoryMarko Tadjer, U.S. Naval Research LaboratoryLunet Luna, U.S. Naval Research LaboratoryAndrew Koehler, U. S. Naval Research LaboratoryKarl D. Hobart, U.S. Naval Research LaboratoryCharles Eddy, US Naval Research LaboratoryJr., Naval Research LaboratoryFritz Kub, Naval Research LaboratoryAris Christou, University of Maryland-College Park -
10b.4 Reliability Assessment of Thermally-Stable Gate Materials for AlGaN/GaN HEMTs
David Shahin, University of MarylandJordan Greenlee, NRC Postdoctoral Fellow Residing at the Naval Research LaboratoryAndrew Koehler, U. S. Naval Research LaboratoryVirginia Wheeler, U.S. Naval Research LaboratoryMarko Tadjer, U.S. Naval Research LaboratoryTatyana Feygelson, U. S. Naval Research LaboratoryBradford Pate, Naval Research LaboratoryJennifer Hite, U.S. Naval Research LaboratoryKarl D. Hobart, U.S. Naval Research LaboratoryCharles Eddy, US Naval Research LaboratoryJr., Naval Research LaboratoryFrancis Kub, U.S. Naval Research LaboratoryAris Christou, University of Maryland-College Park -
11.5 Optimization of AlGaN/GaN HEMT SiN Passivation by Mixed Frequency PECVD
Marko Tadjer, U.S. Naval Research LaboratoryAndrew Koehler, U. S. Naval Research LaboratoryCharles Eddy, US Naval Research LaboratoryJr., Naval Research LaboratoryKarl D. Hobart, U.S. Naval Research LaboratoryFritz Kub, Naval Research Laboratory