Mark Benjamin

Lehighton Electronics Inc,

  • Affect of Wafer Height and Bow on Eddy Current Sheet Resistance Measurements

    Mark Benjamin, Lehighton Electronics Inc,
  • May 19, 2022 // 1:50pm

    17.2 Top Surface Edge Contact for Wafer Level Electrical Characterization of 2DEG in AlGaN/GaN on Semi-insulating Wafers

    Dmitriy Marinskiy, Semilab SDI, Tampa, FL,
    B. Schrayer, Semilab SDI
    Mark Benjamin, Lehighton Electronics Inc,
    J. Lagowski, Semilab SDI
    Marshall Wilson, Semilab SDI, Tampa, FL,
    D. Nguyen, Semilab LEI, Lehighton, PA
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