Mark Goorsky

University of California, Los Angeles

  • 9.2 Investigation of the Impacts of Interfacial Layers on the Degradation of GaN-on-Si HEMTs under Electrical Step Stress Testing

    Luke Yates, Georgia Institute of Technology
    Chien-Fong Lo, IQE
    Tingyu Bai, University of California, Los Angeles
    Mark Goorsky, University of California, Los Angeles
    Wayne Johnson, IQE
    Samuel Graham, Georgia Institute of Technology
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  • 12.0.7.2024 Lapping and Chemical Mechanical Polishing of wide and ultra-wide bandgap semiconductors

    K. Pan, University of California Los Angeles
    K. Huynh, University of California, Los Angeles
    M.S. Goorsky, University of California, Los Angeles
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