Rainier Lee

Skyworks Solutions, Inc.

  • 11.1.2.2024 Optimization of Photolithography Process for BiHEMT Gate Layer with High Critical Dimension Uniformity

    Stephanie Y. Chang, Skyworks Solutions, Inc.
    Tom Brown, Skyworks Solutions, Inc.
    Randy Bryie, Skyworks Solutions, Inc.
    Rainier Lee, Skyworks Solutions, Inc.
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