Robert Waco

Qorvo Inc.

  • eDataLyzer Application on Solving DS Yield Issue with Starburst Pattern

    Kim Kok Gan, Bistel America Inc
    Yiping Wang, Qorvo Inc.
    Robert Waco, Qorvo Inc.
    Matthew Johnson, Qorvo Inc.
    Pat Hamilton, Qorvo Inc.
    Jinhong Yang, Qorvo
    Dana Schwartz
    Corey Nevers, Qorvo, Inc
    Edward Elkan, Qorvo Inc.
    Kaushik Vaidyanathan, Qorvo Inc.

    A die sort (DS) yield loss forming a ‘starburst’ pattern in a wafermap was observed in a pHEMT technology manufactured by Qorvo. Typical data analysis performed by yield engineers was unable to correlate the failure root cause to a specific process step. To help drive to root cause, Bistel was consulted on the use of eDataLyzer (eDL) software.

    This paper will describe the ‘starburst’ DS yield loss pattern in details, followed by the application of Bistel’s eDL software combined with process tool Fault Detection and Correlation (FDC), and end with the validation of the failure mode.

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  • 17.1 RF DS Yield Improvement through ZONAL Technique for pHEMT Product

    Yiping Wang, Qorvo Inc.
    Pat Hamilton, Qorvo Inc.
    Robert Waco, Qorvo Inc.
    Jeremy Middleton*, TriQuint Semiconductor, Inc.
    Frank Barnes, Qorvo Inc.
    Andrew Choo, UP! Strategies Consulting
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  • 17.5 Chemical Attack of a pHEMT Channel Due to Poor Passivation Coverage

    Robert Waco, Qorvo Inc.
    Corey Nevers, Qorvo, Inc
    Val Besong, Qorvo, Inc.
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  • 4.3 Systematic Data Mining Approaches for Yield Improvement

    Yiping Wang, Qorvo Inc.
    Pat Hamilton, Qorvo Inc.
    Robert Waco, Qorvo Inc.
    Jeremy Middleton*, TriQuint Semiconductor, Inc.
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  • 7b.2 Fabrication Process Induced ESD Damage of MIM Capacitors on a 0.15um pHEMT Process

    Robert Waco, Qorvo Inc.
    Rose Emergo, Qorvo, Inc.
    Steve Brockett, Qorvo, Inc.
    Tertius Rivers
    Yiping Wang, Qorvo Inc.
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