Shih-Kuei Chou

WIN Semiconductors Corp
  • 2.5.2021 A Deep Learning-based Multi-model Method for Etching Defect Image Classification

    Shih-Kuei Chou, WIN Semiconductors Corp
    Yuan-Hsin Lin, WIN Semiconductors Corp
    Wen-Hsing Liao, WIN Semiconductors Corp
    Yu-Min Hsu, WIN Semiconductors Corp
    Chi-Hsiang Kuo, WIN Semiconductors Corp
    Cheng-Kuo Lin, WIN Semiconductors Corp

    [embeddoc url=”http://csmantech.org/wp-content/uploads/Digest/Digests-2021/2.5.2021-A-Deep-Learning-based-Multi-model-Method-for-Etching-Defect-Image-Classification.pdf” download=”all” viewer=”google”]

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