Stanley Hsieh
I-Te Cho, Walter Wohlmuth WIN Semiconductors Corp.
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Quality and throughput improvement of GaN/SiC wafer saw with the addition of ultrasonic power
Fraser Wang, WIN Semiconductors CorpVincent Hsu, I-Te Cho, Walter Wohlmuth WIN Semiconductors Corp.Stanley Hsieh, I-Te Cho, Walter Wohlmuth WIN Semiconductors Corp. -
Method for Forming Through Wafer Vias in GaN on SiC Devices and Circuits
Chia-Hao Chen, WIN Semiconductors CorpYu-Wei Chang, WIN Semiconductors CorpMing-Hung Weng, I-Te Cho, Walter Wohlmuth WIN Semiconductors Corp.Ricky Chang, I-Te Cho, Walter Wohlmuth WIN Semiconductors Corp.Shih-Hui Huang, WIN Semiconductors CorpFraser Wang, WIN Semiconductors CorpYi-Feng Wei, I-Te Cho, Walter Wohlmuth WIN Semiconductors Corp.Stanley Hsieh, I-Te Cho, Walter Wohlmuth WIN Semiconductors Corp. -
Development and Control of a 0.25μm Gate Process Module for AlGaN/GaN HEMT Production
Wei-Chou Wang, WIN Semiconductors Corp.Chia-Hao Chen, WIN Semiconductors CorpJhih-Han Du, WIN Semiconductors CorpMing-Hung Weng, I-Te Cho, Walter Wohlmuth WIN Semiconductors Corp.Willie HuangRicky Chang, I-Te Cho, Walter Wohlmuth WIN Semiconductors Corp.Shih-Hui Huang, WIN Semiconductors CorpYi-Feng Wei, I-Te Cho, Walter Wohlmuth WIN Semiconductors Corp.Stanley Hsieh, I-Te Cho, Walter Wohlmuth WIN Semiconductors Corp.Michael CasbonPaul J. TaskerWen-Kai Wang, WIN Semiconductors Corp.I-Te Cho, WIN Semiconductors Corp.