Steven Ringel

Ohio State University

  • 11.3 Ec-0.90 eV Trap-Induced Threshold Voltage Instability in GaN/Si MISHEMTs

    Wenyuan Sun, the Ohio State University
    Steven Ringel, Ohio State University
    Aaron Arehart, the Ohio State University
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  • 4.1.1.2024 (Invited) Electrostatic Engineering for High-Performance Gallium Oxide Devices

    Sushovan Dhara, Ohio State University
    Ashok Dheenan, Ohio State University
    Nathan Wriedt, Ohio State University
    Joe McGlone, Ohio State University
    Jinwoo Hwang, Ohio State University
    Steven Ringel, Ohio State University
    Hongping Zhao, Ohio State University
    Siddharth Rajan, Ohio State University
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