T. Boles

MACOM Technology Solutions, Lincoln Laboratory

  • Effect of Multi-Field Plates on GaN-on-Silicon HEMTs Reverse Breakdown and Leakage Characteristics

    T. Boles, MACOM Technology Solutions, Lincoln Laboratory
    D. Carlson, MACOM Technology Solutions, Lincoln Laboratory
    L. Xia, MACOM Technology Solutions, Lincoln Laboratory
    A. Kaleta, MACOM Technology Solutions, Lincoln Laboratory
    C. McLean, MACOM Technology Solutions, Lincoln Laboratory
    D. Jin, MACOM Technology Solutions, Lincoln Laboratory
    T. Palacios, MACOM Technology Solutions, Lincoln Laboratory
    G. W. Turner, MACOM Technology Solutions, Lincoln Laboratory
    R. J. Molnar, MACOM Technology Solutions, Lincoln Laboratory
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