Student Presentation
[embeddoc url=”https://csmantech.org/wp-content/uploads/2022/03/18.19.2022-Reliability-Study-of-Vertical-GaN-PIN-Rectifiers.pdf” download=”all”]
Ted Laurence
2Lawrence Livermore National Laboratory, Livermore, CA
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May 12, 2022 // 3:20pm
18.19 Reliability Study of Vertical GaN PIN Rectifiers and The Origin of Premature Breakdown
Minkyu Cho, Georgia Institute of Technology, Atlanta, GAMarzieh Bakhtiary Noodeh, Georgia Institute of Technology, Atlanta, GATheeradetch Detchphrom, Georgia Institute of Technology, Atlanta, GARussell D. Dupuis, Georgia Institute of TechnologyShyh-Chiang Shen, Georgia Institute of TechnologyQinghui Shao, 2Lawrence Livermore National Laboratory, Livermore, CATed Laurence, 2Lawrence Livermore National Laboratory, Livermore, CAMatthias Daeumer, Lawrence Livermore National Laboratory, Livermore, CAJae-Hyuck Yoo, Lawrence Livermore National Laboratory, Livermore, CAZhiyu Xu, Georgia Institute of Technology,Download Paper