Thomas O’brien Jr.

  • 8.3 Controlling Impurity-Induced Disordering Via Mask Strain for High-Performance Vertical-Cavity Surface-Emitting Lasers

    Patrick Su, University of Illinois at Urbana-Champaign
    Thomas O’brien Jr.
    Fu-Chen Hsiao, University of Illinois at Urbana-Champaign
    John M Dallesasse, University of Illinois at Urbana-Champaign
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