Tim Kennedy

  • Performance and Reliability of AlGaN/GaN HEMT o_blankn 100-mm SiC Substrate with Improved Epitaxial Growth Uniformity

    Sangmin Lee, Wavice Inc.
    Tim Kennedy
    Christer Hallin
    Helder Antunes
    Brian Fetzer
    Scott T. Sheppard
    Al Burk, Wolfspeed, A Cree Company
    Don A. Gajewski
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