Wei-Chou Wang

WIN Semiconductors Corporation
  • 5.2.2021 Investigation of Un-doped GaN Cap Layer on RF and Trap Related Characteristics in AlGaN/GaN HEMTs

    Wen-Hsin Wu, WIN Semiconductors Corporation
    Yong-Han Lin, WIN Semiconductors Corporation
    Che-Kai Lin, WIN Semiconductors Corporation
    Wei-Chou Wang, WIN Semiconductors Corporation
    Loader Loading...
    EAD Logo Taking too long?

    Reload Reload document
    | Open Open in new tab

    Download [162.00 B]

    Download Paper