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Wen-Hsin Wu
WIN Semiconductors Corporation
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5.2.2021 Investigation of Un-doped GaN Cap Layer on RF and Trap Related Characteristics in AlGaN/GaN HEMTs
Wen-Hsin Wu, WIN Semiconductors CorporationYong-Han Lin, WIN Semiconductors CorporationChe-Kai Lin, WIN Semiconductors Corp.Wei-Chou Wang, WIN Semiconductors Corp.Download Paper -
2.2.4.2024 The 50V GaN HEMT with Memory Effect Suppression
Wayne Lin, WIN Semiconductors CorpWen-Hsin Wu, WIN Semiconductors CorporationChien-Rong Yu, WIN Semiconductors Corp.Yu-Li Ho, WIN Semiconductors Corp.Edison Chou, WIN Semiconductors Corp.Jia-Jyun Guo, WIN Semiconductors Corp.Che-Kai Lin, WIN Semiconductors Corp.Wei-Chou Wang, WIN Semiconductors Corp.Yu-Syuan Lin, WIN Semiconductors Corp.Cheng-Kao Lin, WIN Semiconductors Corp.Loading...