Wen-Hsin Wu

WIN Semiconductors Corporation
  • 5.2.2021 Investigation of Un-doped GaN Cap Layer on RF and Trap Related Characteristics in AlGaN/GaN HEMTs

    Wen-Hsin Wu, WIN Semiconductors Corporation
    Yong-Han Lin, WIN Semiconductors Corporation
    Che-Kai Lin, WIN Semiconductors Corp.
    Wei-Chou Wang, WIN Semiconductors Corp.
    Loader Loading...
    EAD Logo Taking too long?

    Reload Reload document
    | Open Open in new tab

    Download [162.00 B]

    Download Paper
  • 2.2.4.2024 The 50V GaN HEMT with Memory Effect Suppression

    Wayne Lin, WIN Semiconductors Corp
    Wen-Hsin Wu, WIN Semiconductors Corporation
    Chien-Rong Yu, WIN Semiconductors Corp.
    Yu-Li Ho, WIN Semiconductors Corp.
    Edison Chou, WIN Semiconductors Corp.
    Jia-Jyun Guo, WIN Semiconductors Corp.
    Che-Kai Lin, WIN Semiconductors Corp.
    Wei-Chou Wang, WIN Semiconductors Corp.
    Yu-Syuan Lin, WIN Semiconductors Corp.
    Cheng-Kao Lin, WIN Semiconductors Corp.
    Loader Loading...
    EAD Logo Taking too long?

    Reload Reload document
    | Open Open in new tab

    Download [1.20 MB]