Wen-Hsin Wu

WIN Semiconductors Corporation

  • 5.2.2021 Investigation of Un-doped GaN Cap Layer on RF and Trap Related Characteristics in AlGaN/GaN HEMTs

    Wen-Hsin Wu, WIN Semiconductors Corporation
    Yong-Han Lin, WIN Semiconductors Corporation
    Che-Kai Lin, WIN Semiconductors Corp.
    Wei-Chou Wang, WIN Semiconductors Corp.

    [embeddoc url=”http://csmantech.org/wp-content/uploads/Digest/Digests-2021/5.2.2021-CS-MANTECH_Final-Paper_Wen-Hsin-Wu.pdf” download=”all” viewer=”google”]

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  • 2.2.4.2024 The 50V GaN HEMT with Memory Effect Suppression

    Wayne Lin, WIN Semiconductors Corp
    Wen-Hsin Wu, WIN Semiconductors Corporation
    Chien-Rong Yu, WIN Semiconductors Corp.
    Yu-Li Ho, WIN Semiconductors Corp.
    Edison Chou, WIN Semiconductors Corp.
    Jia-Jyun Guo, WIN Semiconductors Corp.
    Che-Kai Lin, WIN Semiconductors Corp.
    Wei-Chou Wang, WIN Semiconductors Corp.
    Yu-Syuan Lin, WIN Semiconductors Corp.
    Cheng-Kao Lin, WIN Semiconductors Corp.

    [embeddoc url=”https://csmantech.org/wp-content/uploads/2024/06/2.2.4.2024-The-50V-GaN-HEMT-with-Memory-Effect-Suppression.pdf” download=”all”]