[embeddoc url=”http://csmantech.org/wp-content/uploads/Digest/Digests-2021/5.2.2021-CS-MANTECH_Final-Paper_Wen-Hsin-Wu.pdf” download=”all” viewer=”google”]
Wen-Hsin Wu
WIN Semiconductors Corporation
-
5.2.2021 Investigation of Un-doped GaN Cap Layer on RF and Trap Related Characteristics in AlGaN/GaN HEMTs
Wen-Hsin Wu, WIN Semiconductors CorporationYong-Han Lin, WIN Semiconductors CorporationChe-Kai Lin, WIN Semiconductors CorporationFan-Hsiu Huang, WIN Semiconductors CorporationWei-Chou Wang, WIN Semiconductors CorporationDownload Paper