Yong-Han Lin

WIN Semiconductors Corporation

  • 5.2.2021 Investigation of Un-doped GaN Cap Layer on RF and Trap Related Characteristics in AlGaN/GaN HEMTs

    Wen-Hsin Wu, WIN Semiconductors Corporation
    Yong-Han Lin, WIN Semiconductors Corporation
    Che-Kai Lin, WIN Semiconductors Corporation
    Wei-Chou Wang, WIN Semiconductors Corporation
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