Yuan-Hsin Lin

WIN Semiconductors Corp

  • 2.5.2021 A Deep Learning-based Multi-model Method for Etching Defect Image Classification

    Shih-Kuei Chou, WIN Semiconductors Corp
    Yuan-Hsin Lin, WIN Semiconductors Corp
    Wen-Hsing Liao, WIN Semiconductors Corp
    Yu-Min Hsu, WIN Semiconductors Corp
    Chi-Hsiang Kuo, WIN Semiconductors Corp
    Cheng-Kuo Lin, WIN Semiconductors Corp
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