Zhiyu Xu

Georgia Institute of Technology,
  • May 12, 2022 // 3:20pm

    18.19 Reliability Study of Vertical GaN PIN Rectifiers and The Origin of Premature Breakdown

    Minkyu Cho, Georgia Institute of Technology, Atlanta, GA
    Marzieh Bakhtiary Noodeh, Georgia Institute of Technology, Atlanta, GA
    Theeradetch Detchphrom, Georgia Institute of Technology, Atlanta, GA
    Russell D. Dupuis, Georgia Institute of Technology
    Shyh-Chiang Shen, Georgia Institute of Technology
    Qinghui Shao, 2Lawrence Livermore National Laboratory, Livermore, CA
    Ted Laurence, 2Lawrence Livermore National Laboratory, Livermore, CA
    Matthias Daeumer, Lawrence Livermore National Laboratory, Livermore, CA
    Jae-Hyuck Yoo, Lawrence Livermore National Laboratory, Livermore, CA
    Zhiyu Xu, Georgia Institute of Technology,

    Student Presentation

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  • 8.5.2021 A Study of Wafer-Scale Breakdown Characteristics of Vertical GaN PIN Rectifiers

    Minkyu Cho, Georgia Institute of Technology, Atlanta, GA
    Matthias Daeumer, Lawrence Livermore National Laboratory, Livermore, CA
    Jae-Hyuck Yoo, Lawrence Livermore National Laboratory, Livermore, CA
    Marzieh Bakhtiary Noodeh, Georgia Institute of Technology, Atlanta, GA
    Qinghui Shao, 2Lawrence Livermore National Laboratory, Livermore, CA
    Zhiyu Xu, Georgia Institute of Technology,
    Theeradetch Detchprohm, Georgia Institute of Technology
    Russell D. Dupuis, Georgia Institute of Technology
    Shyh-Chiang Shen, Georgia Institute of Technology
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  • May 12, 2022 // 9:15am

     13.3 Highly-Linear and Efficient mm-Wave GaN HEMT Technology

    Jeong-Sun Moon, HRL Laboratories, Malibu, CA,
    Robert Grabar, HRL Laboratories, Malibu, CA,
    Erdem Arkun, HRL Laboratories, Malibu, CA,
    Joe Tai, HRL Laboratories, Malibu, CA,
    David Fanning, HRL Laboratories, Malibu, CA,
    Patrick Fay, University of Notre Dame
    Joel Wong, HRL Laboratories, Malibu, CA,
    Didiel Vazquez-Morales, HRL Laboratories, Malibu, CA,
    Chuong Dao, HRL Laboratories, Malibu, CA,
    Shyam Bharadwaj, HRL Laboratories, Malibu, CA,
    Nivedhita Venkatesan, University of Notre Dame
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  • 7.2.4.2024 Edge Termination Engineering with Shallow Bevel Mesas for Low-Leakage Vertical GaN-based p-i-n Avalanche Photodiode

    Zhiyu Xu, Georgia Institute of Technology,
    Theeradetch Detchprohm, Georgia Institute of Technology
    Shyh-Chiang Shen, Georgia Institute of Technology
    A. Nepomuk Otte, Georgia Institute of Technology
    Russell D. Dupuis, Georgia Institute of Technology
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