10.5.2023 Accuracy of Machine Learning Models on Predicting the Properties of Vertical GaN Diodes

James Gallagher, U.S. Naval Research Laboratory
Michael A. Mastro, U.S. Naval Research Laboratory
Mona Ebrish, Vanderbilt University, Nashville, TN
Alan Jacobs, U.S. Naval Research Laboratory, Washington DC
Brendan. P. Gunning, Sandia National Labs, Albuquerque, NM
Robert Kaplar, Sandia National Labs, Albuquerque, NM

10.5.2023_Gallagher