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12.5.2023 Short-circuit Failure Mechanisms of 1.2 kV 4H-SiC MOSFETs under Different Drain Voltages
Dongyoung Kim, University of New York Polytechnic Institute Colleges of Nanoscale Science and Engineering
Woongje Sung, University of New York Polytechnic Institute Colleges of Nanoscale Science and Engineering
12.5.2023 CS_MANTECH-Final-Paper-Dongyoung Kim
