18.14.2023 A new methodology to extract saturation velocity of In0.53Ga0.47As QW HEMTs
Hyo-Jin Kim, Kyungpook National University
Ji-Hoon Yoo, School of Electronic and Electrical Engineering, Kyungpook National University
Wan-Soo Park, Kyungpook National University
Hyeon-Bhin Jo, School of Electronic and Electrical Engineering, Kyungpook National University
In-Geun Lee, Kyungpook National University
Tae-Woo Kim, University of Ulsan, Ulsan, South Korea
Sang-Kuk Kim, QSI, Cheon-An, Kyunggi-do, 31044, South Korea
Yong-Hyun Kim, QSI, Cheon-An, Kyunggi-do, 31044, South Korea
Jacob Yun, QSI
Ted Kim, QSI
Takuya Tsutsumi, QSI, Cheon-An, Kyunggi-do, 31044, South Korea
Hiroki Sugiyama, NTT Device Technology Laboratories, NTT Corporation, Kanagawa, Japan
Hideaki Matsuzaki, NTT Device Technology Laboratories, NTT Corporation, Kanagawa, Japan
Jae-Hak Lee, Kyungpook National University
Dae-Hyun Kim, Kyungpook National University