2.6.2021 Kelvin Force Microscopy and Micro-Raman Correlation Study of Triangular Defects in 4H-SiC

Dmitriy Marinskiy, Semilab SDI, Tampa, FL,
M. Wilson, Semilab SDI
Carlos Almeida, Semilab SDI
S. Savtchouk, Semilab SDI,
Jacek Lagowski, Semilab SDI, Tampa, FL,
S. Toth, Semilab ZRT
L. Badeeb, Semilab ZRT
A. Faragó, Semilab ZRT
Loader Loading...
EAD Logo Taking too long?

Reload Reload document
| Open Open in new tab

Download [178.00 B]

Download Paper