5.3.2021 Analysis of GaN-HEMT DC-Characteristic Alterations by Gate Encapsulation Layer - CS MANTECH Conference CS MANTECH Conference

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5.3.2021 Analysis of GaN-HEMT DC-Characteristic Alterations by Gate Encapsulation Layer

Hossein Yazdani, Ferdinand-Braun-Institut,

Serguei Chevtchenko, Ferdinand-Braun-Institut,

Joachim Würfl, Ferdinand-Braun-Institut

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