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Explore
Our Mission
Board of Directors
Executive Committee
Technical Program Committee
2022 Conference Collage
Sponsors
Exhibitor
Authors
Digests
Contact
May 11, 2022 // 11:40am
7.3 Reliability Assessment of 940 nm VCSEL Array based on Pulsed Mode Thermal Analysis
Mingwei Tsai, WIN semiconductors
Yin-Hsiang Lin, WIN Semiconductors Corp.
Chun-Tse Chang, WIN Semiconductors Corp.
Kai-Lun Chi, WIN Semiconductors Corp.
Lap-Sum Yip, WIN Semiconductors Corp.
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