7.3 Reliability Assessment of 940 nm VCSEL Array based on Pulsed Mode Thermal Analysis

May 11, 2022 // 11:40am

Mingwei Tsai, WIN semiconductors

Yin-Hsiang Lin, WIN Semiconductors Corp.

Chun-Tse Chang, WIN Semiconductors Corp.

Kai-Lun Chi, WIN Semiconductors Corp.

Lap-Sum Yip, WIN Semiconductors Corp.

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