7.3 Reliability Assessment of 940 nm VCSEL Array based on Pulsed Mode Thermal Analysis - CS MANTECH Conference CS MANTECH Conference

Abstract Submission Site is LIVE! The first 10 abstracts submitted and accepted will be eligible for a prize drawing.

Submission Link

May 11, 2022 // 11:40am

7.3 Reliability Assessment of 940 nm VCSEL Array based on Pulsed Mode Thermal Analysis

Mingwei Tsai, WIN semiconductors

Yin-Hsiang Lin, WIN Semiconductors Corp.

Chun-Tse Chang, WIN Semiconductors Corp.

Kai-Lun Chi, WIN Semiconductors Corp.

Lap-Sum Yip, WIN Semiconductors Corp.

Loading...

Taking too long?

Reload document

|

Open in new tab

Download [845.67 KB]

Download Paper