May 11, 2022 // 11:40am

7.3 Reliability Assessment of 940 nm VCSEL Array based on Pulsed Mode Thermal Analysis

Fan-Hsiu Huang, WIN Semiconductors Corp
Mingwei Tsai, WIN semiconductors
Yin-Hsiang Lin, WIN Semiconductors Corp.
Chun-Tse Chang, WIN Semiconductors Corp.
Kai-Lun Chi, WIN Semiconductors Corp.
Lap-Sum Yip, WIN Semiconductors Corp.

Abstract

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