Benoît Lambert

United Monolithic Semiconductors Germany
  • 10b.5 Transient Thermoreflectance for Device Temperature Assessment in Pulsed-Operated GaN-based HEMTs

    Sara Martin Horcajo, Centre for Device Thermography and Reliability (CDTR), University of Bristol
    James Pomeroy, University of Bristol
    Benoît Lambert, United Monolithic Semiconductors Germany
    Helmut Jung, United Monolithic Semiconductors GmbH, Ulm, Germany
    Martin Kuball, University of Bristol
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