Bradford Pate

Naval Research Laboratory

  • 5.3 Influence of Substrate Removal on the Electrothermal Characteristics of AlGaN/GaN Membrane High Electron Mobility Transistors

    Marko Tadjer, Naval Research Laboratory
    Peter Raad, TMX Scientific and Southern Methodist University
    Tatyana Feygelson, Naval Research Laboratory
    Andrew Koehler, Naval Research Laboratory
    Travis Anderson, Naval Research Laboratory
    Bradford Pate, Naval Research Laboratory
    Karl Hobart, Naval Research Laboratory
    Fritz Kub, Naval Research Laboratory
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  • 10b.4 Reliability Assessment of Thermally-Stable Gate Materials for AlGaN/GaN HEMTs

    David Shahin, University of Maryland
    Travis Anderson, Naval Research Laboratory
    Jordan Greenlee, NRC Postdoctoral Fellow Residing at the Naval Research Laboratory
    Andrew Koehler, Naval Research Laboratory
    Virginia Wheeler, U.S. Naval Research Laboratory
    Marko Tadjer, Naval Research Laboratory
    Tatyana Feygelson, Naval Research Laboratory
    Bradford Pate, Naval Research Laboratory
    Jennifer Hite, U.S. Naval Research Laboratory
    Karl Hobart, Naval Research Laboratory
    Charles Eddy, US Naval Research Laboratory
    Jr., Naval Research Laboratory
    Francis Kub, U.S. Naval Research Laboratory
    Aris Christou, University of Maryland-College Park
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