Chi-Hsiang Kuo

WIN Semiconductors Corp

  • 2.5.2021 A Deep Learning-based Multi-model Method for Etching Defect Image Classification

    Shih-Kuei Chou, WIN Semiconductors Corp
    Yuan-Hsin Lin, WIN Semiconductors Corp
    Wen-Hsing Liao, WIN Semiconductors Corp
    Yu-Min Hsu, WIN Semiconductors Corp
    Chi-Hsiang Kuo, WIN Semiconductors Corp
    Cheng-Kuo Lin, WIN Semiconductors Corp
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  • 18.9.2023 3-D Derived Structure Electromagnetic Simulation for Enhancement Mode Low Noise pHEMT Technology.

    Kuan-Hua Chen, WIN Semiconductors Corp.
    Shou-Hsien Weng, WIN Semiconductors Corp.
    Shih-Wei Chen, WIN Semiconductors Corp.
    Chi-Ming Lin, WIN Semiconductors Corp.
    Jia-Shyan Wu, WIN Semiconductors Corp.
    Chi-Hsiang Kuo, WIN Semiconductors Corp

    18.09.2023 Chen Final

  • May 10, 2022 // 4:30pm

    4.2 Machine Learning-Based Methods For In-Time Monitoring Equipment Conditions Wei-You Chen

    Wei-You Chen, WIN Semiconductors Corp.
    Min-Chung Chuang, WIN Semiconductors Corp.
    Yu-Min Hsu, WIN Semiconductors Corp.
    Chi-Hsiang Kuo, WIN Semiconductors Corp.
    Cheng-Kuo Lin, WIN Semiconductors Corp
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