Chun-Tse Chang

WIN Semiconductors Corp.
  • May 11, 2022 // 11:40am

    7.3 Reliability Assessment of 940 nm VCSEL Array based on Pulsed Mode Thermal Analysis

    Fan-Hsiu Huang, WIN Semiconductors Corp
    Mingwei Tsai, WIN semiconductors
    Yin-Hsiang Lin, WIN Semiconductors Corp.
    Chun-Tse Chang, WIN Semiconductors Corp.
    Kai-Lun Chi, WIN Semiconductors Corp.
    Lap-Sum Yip, WIN Semiconductors Corp.

    Abstract

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