Dongyoung Kim
University of New York Polytechnic Institute Colleges of Nanoscale Science and Engineering
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12.5.2023 Short-circuit Failure Mechanisms of 1.2 kV 4H-SiC MOSFETs under Different Drain Voltages
Dongyoung Kim, University of New York Polytechnic Institute Colleges of Nanoscale Science and EngineeringWoongje Sung, University of New York Polytechnic Institute Colleges of Nanoscale Science and Engineering