J. Parke

Northrop Grumman (MS), Linthicum, MD

  • The Effect of Exposure Mode on Feature Resolution and Film Thickness for Thick (>10 µm) BCB

    J. Parke, Northrop Grumman (MS), Linthicum, MD
    A. Gupta
    J. Mason, Northrop Grumman (MS), Linthicum, MD
    K. Renaldo, Northrop Grumman (MS), Linthicum, MD
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  • May 11, 2022 // 5:10pm

    11.3 Reliability without Hermeticity (RWoH) Protection for SLCFET Switch Technology

    Annaliese Drechsler, Northrop Grumman (MS), Linthicum, MD
    R. Lewis, Northrop Grumman (MS), Linthicum, MD
    J. Mason, Northrop Grumman (MS), Linthicum, MD
    M. Scimonelli, Northrop Grumman (MS), Linthicum, MD
    M. Snook, Northrop Grumman (MS), Linthicum, MD
    J. Parke, Northrop Grumman (MS), Linthicum, MD
    K. Renaldo, Northrop Grumman (MS), Linthicum, MD
    M. Lee, Northrop Grumman (MS), Linthicum, MD
    Robert Howell, Northrop Grumman Corporation
    I. Wathuthanthri, Northrop Grumman (MS), Linthicum, MD
    J. Daubert, Northrop Grumman (MS), Linthicum, MD
    J. Kelliher, Northrop Grumman (MS), Linthicum, MD
    N. Edwards, Northrop Grumman (MS), Linthicum, MD
    B. Alt, Northrop Grumman (MS), Linthicum, MD
    J.T. Mlack, Northrop Grumman (MS), Linthicum, MD
    A. Marrakchi El Fellah, Northrop Grumman (MS), Linthicum, MD
    B. Novak, Northrop Grumman (MS), Linthicum, MD
    J. Hong, Northrup GrumNorthrop Grumman (MS), Linthicum, MD

    Abstract

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