J. Würfl

Ferdinand-Braun-Institut (FBH)
  • 11.2.1.2024 Defect Reduction and Yield Improvement of MIM Capacitors

    S. A. Chevtchenko, Ferdinand-Braun-Institut (FBH)
    I. Ostermay, Ferdinand-Braun-Institut (FBH)
    S. Troppenz, Ferdinand-Braun-Institut (FBH)
    J. Würfl, Ferdinand-Braun-Institut (FBH)
    O. Hilt, Ferdinand-Braun-Institut (FBH)

    [embeddoc url=”https://csmantech.org/wp-content/uploads/2024/06/11.2.1.2024-Defect-Reduction-and-Yield-Improvement-of-MIM-Capacitors.pdf” download=”all”]