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Jerome Van de Casteele
United Monolithic Semiconductorss SAS
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3.2.2021 Wafer-Level Packages for RF GaN Technologies & On-Wafer Humidity Test
Hermann Stieglauer, United Monolithic Semiconductors GermanyKlaus Riepe, United Monolithic Semiconductorss GmBHJanina Moereke, United Monolithic Semiconductorss GmBHJan Grünenpütt, United Monolithic Semiconductors FranceHervé Blanck, United Monolithic SemiconductorsDaniel Sommer, United Monolithic Semiconductorss GmBHBenoît Lambert, United Monolithic Semiconductors GermanyJerome Van de Casteele, United Monolithic Semiconductorss SASMehdy Neffati, United Monolithic Semiconductorss SASUlli Hansen, MSG Lithoglas GmbHSimon Maus, MSG Lithoglas GmbHDownload Paper