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K. Renaldo
Northrop Grumman (MS), Linthicum, MD
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The Effect of Exposure Mode on Feature Resolution and Film Thickness for Thick (>10 µm) BCB
J. Parke, Northrop Grumman (MS), Linthicum, MDA. GuptaJ. Mason, Northrop Grumman (MS), Linthicum, MDK. Renaldo, Northrop Grumman (MS), Linthicum, MD -
May 11, 2022 // 5:10pm
11.3 Reliability without Hermeticity (RWoH) Protection for SLCFET Switch Technology
Annaliese Drechsler, Northrop Grumman (MS), Linthicum, MDR. Lewis, Northrop Grumman (MS), Linthicum, MDJ. Mason, Northrop Grumman (MS), Linthicum, MDM. Scimonelli, Northrop Grumman (MS), Linthicum, MDM. Snook, Northrop Grumman (MS), Linthicum, MDJ. Parke, Northrop Grumman (MS), Linthicum, MDK. Renaldo, Northrop Grumman (MS), Linthicum, MDM. Lee, Northrop Grumman (MS), Linthicum, MDRobert Howell, Northrop Grumman CorporationI. Wathuthanthri, Northrop Grumman (MS), Linthicum, MDJ. Daubert, Northrop Grumman (MS), Linthicum, MDJ. Kelliher, Northrop Grumman (MS), Linthicum, MDN. Edwards, Northrop Grumman (MS), Linthicum, MDB. Alt, Northrop Grumman (MS), Linthicum, MDJ.T. Mlack, Northrop Grumman (MS), Linthicum, MDA. Marrakchi El Fellah, Northrop Grumman (MS), Linthicum, MDB. Novak, Northrop Grumman (MS), Linthicum, MDJ. Hong, Northrup GrumNorthrop Grumman (MS), Linthicum, MDDownload Paper