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M.J. Uren
University of Bristol, Bristol, UK
Need for Defects in Floating-Buffer AlGaN/GaN HEMTs
M.J. Uren, University of Bristol, Bristol, UK
M. Silvestri, University of Bristol, NXP Semiconductors Belgium and Netherlands
M. Cäsar, University of Bristol, NXP Semiconductors Belgium and Netherlands
J. W. Pomeroy, University of Bristol, Bristol, UK
G.A.M. Hurkx*, University of Bristol, NXP Semiconductors Belgium and Netherlands
J.A. Croon+, University of Bristol, NXP Semiconductors Belgium and Netherlands
J. Šonský*, University of Bristol, NXP Semiconductors Belgium and Netherlands
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May 11, 2022 // 4:50pm
11.2 Design and Manufacture of Edge Termination in Vertical GaN Diodes: Electric Field Distribution Probed by Second Harmonic Generation
M.J. Uren, University of Bristol, Bristol, UK
M. Kuball, University of Bristol, Bristol, UK
B. Shankar, University of Bristol, Bristol, UK
D. Ji, University of Bristol, Bristol, UK
Y. Cao, University of Bristol, Bristol, UK
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11.2.3.2024 Time-Dependent Conduction Mechanisms in Superlattice Layers on 200 mm Engineered Substrates
Zequan Chen, University of Bristol
Peng Huang, University of Bristol
Indraneel Sanyal, University of Bristol
Matthew Smith, University of Bristol
Michael J Uren, University of Bristol
A. Vohra, imec, Leuven, Belgium
Benoit Bakeroot, imec, Leuven, Belgium and CMST, imec & Ghent University, Ghent, Belgium
Martin Kuball, University of Bristol
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