Mingwei Tsai

WIN semiconductors

  • 6b.2 An Effective Data Analysis Approach to Identify Source of Parametric Performance Variations for GaAs Manufacturing

    Mingwei Tsai, WIN semiconductors
    H T Li, WIN Semiconductors Corp.
    H F Tsai, WIN Semiconductors Corp.
    J W Chen, WIN Semiconductors Corp.
    W H Wang, WIN Semiconductors Corp.
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  • May 11, 2022 // 11:40am

    7.3 Reliability Assessment of 940 nm VCSEL Array based on Pulsed Mode Thermal Analysis

    Mingwei Tsai, WIN semiconductors
    Yin-Hsiang Lin, WIN Semiconductors Corp.
    Chun-Tse Chang, WIN Semiconductors Corp.
    Kai-Lun Chi, WIN Semiconductors Corp.
    Lap-Sum Yip, WIN Semiconductors Corp.

    [embeddoc url=”https://csmantech.org/wp-content/uploads/2023/09/7.3.2022-Reliability-Assessment-of-940-nm-VCSEL-Array.pdf” download=”all”]

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