S. Toth

Semilab ZRT

  • 2.6.2021 Kelvin Force Microscopy and Micro-Raman Correlation Study of Triangular Defects in 4H-SiC

    Dmitriy Marinskiy, Semilab SDI, Tampa, FL,
    M. Wilson, Semilab SDI
    Carlos Almeida, Semilab SDI
    S. Savtchouk, Semilab SDI,
    J. Lagowski, Semilab SDI
    S. Toth, Semilab ZRT
    L. Badeeb, Semilab ZRT
    A. Faragó, Semilab ZRT

    [embeddoc url=”http://csmantech.org/wp-content/uploads/Digest/Digests-2021/2.6.2021-CSMantech-2021-Micro-Triangular-Defects-in-4H-SiC-Paper-DM-rev1b.pdf” download=”all” viewer=”google”]

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