Thomas Peach

Cardiff University
  • May 11, 2022 // 12:00pm

    7.4 Impact of Strain-Induced Bow on the Manufacture of VCSELs on 150mm GaAs- and Ge-Substrate Wafers

    Jack Baker, Cardiff University
    Sara Gillgrass, Cardiff University
    Thomas Peach, Cardiff University
    Craig Allford, Cardiff University
    Andrew D. Johnson, IQE, Cardiff, UK
    Andrew Joel, IQE, Cardiff, UK
    Sung Wook Lim, IQE, Cardiff, UK
    Matthew Geen, IQE, Cardiff, UK
    J. Iwan Davies, IQE plc
    Samuel Shutts, Cardiff University. IQE plc
    Peter M. Smowton, Cardiff University, IQE plc

    Student Presentation

    [embeddoc url=”https://csmantech.org/wp-content/uploads/2023/09/7.4.2022-Impact-of-Strain-Induced-Wafer-Bow.pdf” download=”all”]

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