Woongje Sung

University of New York Polytechnic Institute Colleges of Nanoscale Science and Engineering
  • 12.5.2023 Short-circuit Failure Mechanisms of 1.2 kV 4H-SiC MOSFETs under Different Drain Voltages

    Dongyoung Kim, University of New York Polytechnic Institute Colleges of Nanoscale Science and Engineering
    Woongje Sung, University of New York Polytechnic Institute Colleges of Nanoscale Science and Engineering

    12.5.2023 CS_MANTECH-Final-Paper-Dongyoung Kim