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Explore
Our Mission
Board of Directors
Executive Committee
Technical Program Committee
2022 Conference Collage
Sponsors
Exhibitors
Authors
Digests
Contact
All 2025 Final Papers zipped
Conference App
9.2 Investigation of the Impacts of Interfacial Layers on the Degradation of GaN-on-Si HEMTs under Electrical Step Stress Testing
Luke Yates, Georgia Institute of Technology
Chien-Fong Lo, IQE
Tingyu Bai, University of California, Los Angeles
Mark Goorsky, University of California, Los Angeles
Wayne Johnson, IQE
Samuel Graham, Georgia Institute of Technology
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