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Explore
Our Mission
Board of Directors
Executive Committee
Technical Program Committee
Conference
Conference at a Glance
Advance Program & Sessions
Sponsors
Exhibitor
Exhibitor Floorplan
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9.2 Investigation of the Impacts of Interfacial Layers on the Degradation of GaN-on-Si HEMTs under Electrical Step Stress Testing
Luke Yates, Georgia Institute of Technology
Chien-Fong Lo, IQE
Tingyu Bai, University of California, Los Angeles
Mark Goorsky, University of California, Los Angeles
Wayne Johnson, IQE
Samuel Graham, Georgia Institute of Technology
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