Allen Hanson

MACOM Technology Solutions Inc.

  • Reverse Leakage Current and Breakdown Voltage Improvements in GaN HEMTs and GaN Schottky Diodes

    Timothy Boles, MACOM Technology Solutions
    Ling Xia, MACOM Technology Solutions
    Allen Hanson, MACOM Technology Solutions Inc.
    Anthony Kaleta, MACOM Technology Solutions
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  • 9.4 Statistical Analysis of Lifetimes of MIM Capacitors with Monte Carlo Simulation

    Mingda Zhu, Cornell University
    Chuanxin Lian, MACOM Technology Solutions Inc.
    Huili Xing, Cornell University
    Allen Hanson, MACOM Technology Solutions Inc.
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  • 9.4 Simulation of Fabrication- and Operation-Induced Mechanical Stress in AlGaN/GaN Transistors

    Sameer Joglekar, Massachusetts Institute of Technology
    Chuanxin Lian, MACOM Technology Solutions Inc.
    Rajesh Baskaran, MACOM Technology Solutions Inc.
    Yan Zhang, MACOM Technology Solutions, Inc
    Allen Hanson, MACOM Technology Solutions Inc.
    Download Paper