Dario Nappa

TriQuint Semiconductor,TX

  • The Use of a Structured Approach to Solve Yield Limiting Defects in a Compound Semiconductor Factory

    Jan Campbell
    Qizhi He
    Howie Yang, TriQuint Semiconductor,TX
    Martin Ivie
    John Gibbon, Qorvo
    Darrel Lupo, TriQuint Semiconductor,TX
    Dario Nappa, TriQuint Semiconductor,TX
    Jerry Beene, TriQuint Semiconductor,TX

  • 7b.5 Analysis and Solution to Ion Trim Drift Utilizing Software and a Residual Gas Analyzer

    Eric McCormick, Qorvo, Inc.
    Romek Bobkowski, Qorvo, Inc.
    Karsten Mausolf, Qorvo
    Guy Takayesu, Qorvo
    Dario Nappa, TriQuint Semiconductor,TX
    Francis Celii, Qorvo
    Mike McClure
    Craig Hall, Qorvo
    Joseph Raff, Qorvo
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