J. Iwan Davies

IQE plc
  • May 11, 2022 // 12:00pm

    7.4 Impact of Strain-Induced Bow on the Manufacture of VCSELs on 150mm GaAs- and Ge-Substrate Wafers

    Jack Baker, Cardiff University
    Sara Gillgrass, Cardiff University
    Thomas Peach, Cardiff University
    Craig Allford, Cardiff University
    Andrew D. Johnson, IQE, Cardiff, UK
    Andrew Joel, IQE, Cardiff, UK
    Sung Wook Lim, IQE, Cardiff, UK
    Matthew Geen, IQE, Cardiff, UK
    J. Iwan Davies, IQE plc
    Samuel Shutts, Cardiff University. IQE plc
    Peter M. Smowton, Cardiff University, IQE plc

    Student Presentation

    [embeddoc url=”https://csmantech.org/wp-content/uploads/2023/09/7.4.2022-Impact-of-Strain-Induced-Wafer-Bow.pdf” download=”all”]

    Download Paper

  • 18.4.2023 Characterisation Techniques for On-Wafer Testing of VCSELs in Volume Manufacture

    Jack Baker, Cardiff University
    C. Hentschel, Cardiff University
    Craig Allford, Cardiff University
    Sara Gillgrass, Cardiff University
    J. Iwan Davies, IQE plc
    Samuel Shutts, Cardiff University. IQE plc
    Peter M. Smowton, Cardiff University, IQE plc

    18.04.2023_Extended Abstract_R1_Compressed

  • 8.2.2.2024 QuickSELs Enabling Rapid Feedback to Epitaxy

    Jack Baker, Cardiff University
    Sara Gillgrass, Cardiff University
    Craig Allford, Cardiff University
    J. Iwan Davies, IQE plc
    Samuel Shutts, Cardiff University. IQE plc
    Peter M. Smowton, Cardiff University, IQE plc

    [embeddoc url=”https://csmantech.org/wp-content/uploads/2024/06/8.2.2.2024-QuickSELs-Enabling-Rapid-Feedback-to-Epitaxy.pdf” download=”all”]